Reliability assessment of embedded digital system using multi-state function

Jong Gyun Choi, Poong Hyun Seong Department of Nuclear Engineering, Korea Advanced Institute of Science and Technology, Gusong, Yusong, Daejon 305-701, South Korea Abstract This work describes a combinatorial model for estimating the reliability of the embedded digital system by means of multi-state function. This model includes a coverage model for fault-handling techniques implemented in digital systems. The fault-handling techniques make it difficult for many types of components in digital system to be treated as binary state, good or bad. The multi-state function provides a complete analysis of multi-state systems as which the digital systems can be regarded. Through adaptation of software operational profile flow to multi-state function, the HW/SW interaction is also considered for estimation of the reliability of digital system. Using this model, we evaluate the reliability of one board controller in a digital system, Interposing Logic System (ILS), which is installed in YGN nuclear power units 3 and 4. Since the proposed model is a generalized combinatorial model, the simplification of this model becomes the conventional model that treats the system as binary state. This modeling method is particularly attractive for embedded systems in which small sized application software is implemented since it will require very laborious work for this method to be applied to systems with large software.